The Japan Society of Applied Physics

15:15 〜 15:30

[F-9-06] Identification of deep level defects in CdTe solar cells using transient photo capacitance spectroscopy

〇Chuang Li1,2, Xia Hao1, Yulu He2, Jingquan Zhang1, Lili Wu1, Wei li1, Wenwu Wang1, Lianghuan Feng1, Islam Muhammad Monirul2, Katsuhiro Akimoto2, Takeaki Sakurai2 (1. Sichuan Univ.(China), 2. Univ. of Tsukuba(Japan))

https://doi.org/10.7567/SSDM.2020.F-9-06