19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

We-1: Oxide

Oxide

We-1: Oxide

2022年8月31日(水) 15:00 〜 16:15 DRIP ONLINE CONFERENCE

Chair:Michal Bockowski、Junji Senzaki

15:45 〜 16:00

[We1-3] Relation between propagation angle of dislocations in β-Ga2O3 (001) bulk wafer and their etch pit shapes

*Sou Isaji1, Issei Maeda1, Naoya Ogawa1, Ryo Kosaka1, Noriyuki Hasuike1, Toshiyuki Isshiki1, Kenji Kobayashi2, Yongzhao Yao3, Yukari Ishikawa3 (1. Kyoto Institute of Technology, 2. Hitachi High-Tech Corp., 3. Japan Fine Ceramics Center)