19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

Th-2: SiC-2

SiC

Th-2: SiC-2

2022年9月1日(木) 16:45 〜 18:15 DRIP ONLINE CONFERENCE

Chair:Michael Dudley、Yukari Ishikawa

17:45 〜 18:00

[Th2-4] Cathodoluminescence study of 3C-SiC layer grown on 4H-SiC substrate

*Jun Chen1, Hiroyuki Sazawa2, Wei Yi3, Takashi Sekiguchi4 (1. National Institute for Materials Science, 2. National Institute of Advanced Industrial Science and Technology, 3. Kyoto University, 4. University of Tsukuba)