[Mo-P] Poster Presentation

[Mo-P-21] Quantitative Characterization of Surface Polarity Dependence of Wetting Properties of V-doped SiC using a Novel Image Analysis Technique

*Jung Gon Kim¹, Woo Sik Yoo¹, Dae Sung Kim², Won Jae Lee² (1. WaferMasters, Inc.(United States of America), 2. Dong-Eui Univ.(Korea))