ICSCRM2019

講演情報

Oral Presentation

Characterization and Defect Engineering

[Tu-3B] Quantum Technology II

2019年10月1日(火) 13:45 〜 15:45 Annex Hall 2 (Kyoto International Conference Center)

14:45 〜 15:00

[Tu-3B-04] Optically detected magnetic resonance study of 3D arrayed silicon vacancies in SiC pn diodes

*Yuichi Yamazaki1, Yoji Chiba1,2, Shin-ichiro Sato1, Takahiro Makino1, Naoto Yamada1, Takahiro Satoh1, Kazutoshi Kojima3, Yasuto Hijikata2, Hidekazu Tsuchida4, Norihiro Hoshino4, Takeshi Ohshima1 (1. National Institutes for Quantum and Radiological Science and Technology(Japan), 2. Saitama Univ.(Japan), 3. National Institute of Advanced Industrial Science and Technology(Japan), 4. Central Research Institute of Electric Power Industry(Japan))