*Oleg Rusch1, Carsten Hellinger1, Jonathan Moult2, Yunji Corcoran2, Tobias Erlbacher1,3
(1. Fraunhofer Institute for Integrated Systems and Device Technology IISB(Germany), 2. SMC Diode Solutions, Sangdest Microelectronics(China), 3. Chair of Electron Devices, Friedrich-Alexander-Universität Erlangen-Nürnberg(Germany))