The 182nd ISIJ autumn Meeting

Presentation information

General Presentation

Instrumentation, Control and System Engineering

Instrumentation

Fri. Sep 3, 2021 11:00 AM - 12:00 PM Room5

座長:剱持光俊 [JFE]

会議に参加する

11:40 AM - 12:00 PM

[56] The high sensitivity inspection technique for round billet using synthetic aperture focusing technique

Kazuki Terada1, Yutaka Matsui1 (1.JFE)

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