[28a-PA2-1~14] 7. Beam Technology and Nanofabrication

[28a-PA2-13] Analysis of surface-active agent using FIB-TOF-SIMS

^○（PC）Miwa Ohnishi¹, Tetsuo Sakamoto¹ (Kogakuin Univ.¹)

Keywords:飛行時間型二次イオン質量分析計