The 60th JSAP Spring Meeting,2013

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Regular sessions(Oral presentation)

15. Crystal Engineering » 15.6 IV-group-based compounds

[28p-G22-1~19] 15.6 IV-group-based compounds

Thu. Mar 28, 2013 1:45 PM - 6:45 PM G22 (B5 4F-2406)

[28p-G22-14] Correlation between micro-PCD signals and excess carrier concentrations in SiC

○Masashi Kato1, Yuto Mori1, Masaya Ichimura1 (Nagoya Inst. of Tech.1)

Keywords:SiC、キャリアライフタイム、μ-PCD