The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

06. Thin Films and Surfaces » 6.6 Probe microscopy

[30a-D3-1~13] 6.6 Probe microscopy

Sat. Mar 30, 2013 9:00 AM - 12:30 PM D3 (C5 3F-324)

[30a-D3-1] Observation of Graphene by Magnetic Force Microscopy

Koutatsu Maruishi1, Fujio Wakaya1, Satoshi Abo1, Mikio Takai1 (CQSTEC.Osaka Univ.1)

Keywords:磁気力顕微鏡