The 60th JSAP Spring Meeting,2013

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Regular sessions(Oral presentation)

06. Thin Films and Surfaces » 6.6 Probe microscopy

[30a-D3-1~13] 6.6 Probe microscopy

Sat. Mar 30, 2013 9:00 AM - 12:30 PM D3 (C5 3F-324)

[30a-D3-7] Surface potential measurements on diacetylene thin films in various environments by dual-probe AFM

○Masaharu Hirose1, Eika Tsunemi1, Kei Kobayashi2, Hirofumi Yamada1 (Kyoto Univ.1, SACI, Kyoto Univ.2)

Keywords:導電性探針、ジアセチレン