[14a-A16-1~11] 7.4 Buried interface sciences with quantum beam

[14a-A16-8] Development of X-ray Aided Noncontact Atomic Force Microscopy (XANAM) Toward Elemental and Structural Analysis of the Nanomaterials

〇Shushi Suzuki¹, Shingo Mukai², Chun Wang-Jae³, Masaharu Nomura⁴, Kiyotaka Asakura² (1.Nagoya Univ., 2.Hokkaido Univ., 3.ICU, 4.KEK-PF)

Keywords:Synchrotron X-ray,Noncontact Atomic Force Microscopy,inner shell electron