The 78th JSAP Autumn Meeting, 2017

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9 Applied Materials Science » 9.1 Dielectrics, ferroelectrics

[6a-A502-1~14] 9.1 Dielectrics, ferroelectrics

Wed. Sep 6, 2017 9:00 AM - 12:45 PM A502 (502)

Hajime Nagata(Tokyo Univ. of Sci.), Satoshi Wada(Univ. of Yamanashi), Ueno Shintaro(Yamanashi University)

9:15 AM - 9:30 AM

[6a-A502-2] Evaluation of valence of iron ions in TmFe2O4 using STEM-EELS

〇Shinya Konishi1, Ryo Oota2, Takahisa Arima3, Katsuhisa Tanaka1 (1.Graduate School of Engineering ,Kyoto Univ., 2.Faculty of Engineering, Hokkaido Univ., 3.Graduate School of Frontier Sciences ,The Univ. of Tokyo)

Keywords:Ferroelectric

It is considered that polarization of RFe2O4(R:Ho~Lu,Y,In) is expressed by distribution of valence of iron ions.This time, the distribution of valence of iron ions in c-plane was evaluated by STEM-EELS.
As a result,It was cleared that the strength of divalent was higher than strength of trivalent in Fe of the first layer. On the other hand,it was cleared that the strength of trivalent was higher than strength of divalent in Fe of the second layer.