Development of belt conveyor flaw detection system

Presentation information

第VI部門

Fri. Sep 15, 2023 9:00 AM - 10:20 AM VI-3 (広島工業大五日市キャンパス三宅の森Nexus21 505)

Chair: Ryohei Kasai

9:00 AM - 9:10 AM

*Takahiro Maesaki¹, Hirao Sen¹, Okamura kosei¹, Ohnuki nanami¹, kato hiromu¹ (1. Shimizu Corp)

Keywords:Flaw detection, Belt conveyor, Image thresholding, RFID

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