Probe Microscopy Analysis of Defect-Driven Analog Memory Functions of TaO<sub>x</sub> for Neuromorphic Computing

Atsushi Tsurumaki-Fukuchi

14:00 〜 15:30

[D3-PR13-03] Probe Microscopy Analysis of Defect-Driven Analog Memory Functions of TaO_x for Neuromorphic Computing

*Atsushi Tsurumaki-Fukuchi¹, Takayoshi Katase², Hiromichi Ohta³, Masashi Arita¹, Yasuo Takahashi¹ (1. Faculty of IST, Hokkaido Univ. (Japan), 2. MSL, Tokyo Tech. (Japan), 3. RIES, Hokkaido Univ. (Japan))

キーワード：Memristor, Neuromorphic Device, Defect Migration, Tantalum Oxide, Probe Microscopy, Resistive Switching

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講演情報

[D3-PR13] Slot 13

[D3-PR13-03] Probe Microscopy Analysis of Defect-Driven Analog Memory Functions of TaO_x for Neuromorphic Computing

講演情報

[D3-PR13] Slot 13

[D3-PR13-03] Probe Microscopy Analysis of Defect-Driven Analog Memory Functions of TaOx for Neuromorphic Computing

[D3-PR13-03] Probe Microscopy Analysis of Defect-Driven Analog Memory Functions of TaO_x for Neuromorphic Computing