[Session 5] Interface and Reliability/Variability

[Session_5-06] Random Telegraph Noise Simulation and the Impact on Noise Sensitive Design

*Menglin Lu¹, Chienming Hung¹, Minglong Fan¹, Yishuo kasa Huang¹, Chaochieh Matt Li¹, Minshueh Yuan¹, Chihhsien Chang¹, Tsungshih Chiang¹, Kewei Su¹, Chungkai Lin¹ (1. TSMC)