[S-III-6] Correlation between Atomic-Scale Structures and Electronic Properties at Compound Semiconductor Layered Interfaces

Hideki HASEGAWA, Hideo OHNO, Tetsuya HAGA, Yutaka ABE, Heishichirou TAKAHASHI, Takayuki SAWADA, Li HE, Hirotatsu ISHII (1.Department of Electrical Engineerirg, Faculty of Engineering Hokkaido Uuiversity, 2.Dept. of Nuclear Eng., 3.Dept. of Metallurgical Eng., 4.Dept. of Electronic Eng., University of Electro-Communications)

https://doi.org/10.7567/SSDM.1987.S-III-6