Assessment of Hot Carrier Effects on the High Frequency Characteristics of NMOS Transistors

J. H. Yoo; K. D. Yoo; J. H. Jin; G. H. Lim; Y. S. Choi; D. G. Kim; S. K. Lim; K. H. Choi

doi:https://doi.org/10.7567/SSDM.1993.LC-6

1993 International Conference on Solid State Devices and Materials

1993年8月29日〜 1993年9月1日
Makuhari Messe, Chiba, Japan

[LC-6] Assessment of Hot Carrier Effects on the High Frequency Characteristics of NMOS Transistors

J. H. Yoo、K. D. Yoo、J. H. Jin、G. H. Lim、Y. S. Choi、D. G. Kim、S. K. Lim、K. H. Choi (1.Process Development Dept., Micro Division, Samsung Electronics Co.)

https://doi.org/10.7567/SSDM.1993.LC-6

▲