[A-4-1] Quantized Conductance of a Silicon Wire Fabricated Using SIMOX Technology

Y. Nakajima, Y. Takahashi, S. Horiguchi, K. Iwadate, H. Namatsu, K. Kurihara, M. Tabe (1.LSI Laboratories, Nippon Telegraph and Telephone Co., Ltd.)

https://doi.org/10.7567/SSDM.1994.A-4-1