[A-4-1] Quantized Conductance of a Silicon Wire Fabricated Using SIMOX Technology

Y. Nakajima、Y. Takahashi、S. Horiguchi、K. Iwadate、H. Namatsu、K. Kurihara、M. Tabe (1.LSI Laboratories, Nippon Telegraph and Telephone Co., Ltd.)

https://doi.org/10.7567/SSDM.1994.A-4-1