[PD-7-3] Built-in Electric Field Strength in InP/n+-InP Determined by Photoellipsometry and Photoreflectance

Yi-Ming XIONG、Tadashi SAITOH Hiroyuki YAGUCHI、Yasuhiro SHIRAKI (1.Division of Electronic and Information Engineering Tokyo University of Agriculture and Technology、2.Research Center for Advanced Science and Technology University of Tokyo)

https://doi.org/10.7567/SSDM.1996.PD-7-3