Characterization and Control of MBE-ZnSe/GaAs(100) Substrate Interface and Regrown ZnSe/ZnSe Homointerface

Yuji YAMAGATA; Kohji FUJIWARA; Takayuki SAWADA; Kazuaki IMAI; Kazuhiko SUZUKI; Naohito KIMURA; Isao TSUBONO

doi:https://doi.org/10.7567/SSDM.1996.Sympo.V-7

[Sympo.V-7] Characterization and Control of MBE-ZnSe/GaAs(100) Substrate Interface and Regrown ZnSe/ZnSe Homointerface

Yuji YAMAGATA、Kohji FUJIWARA、Takayuki SAWADA、Kazuaki IMAI、Kazuhiko SUZUKI、Naohito KIMURA、Isao TSUBONO (1.Department of Applied Electronics, Hokkaido Institute of Technology)

https://doi.org/10.7567/SSDM.1996.Sympo.V-7

1996 International Conference on Solid State Devices and Materials

[Sympo.V-7] Characterization and Control of MBE-ZnSe/GaAs(100) Substrate Interface and Regrown ZnSe/ZnSe Homointerface