[C-9-4] Time Dependent Anomalous Charge Loss Modeling in Flash Memories and an Accelerated Testing Procedure
Franz Schuler、Georg Tempel、Hanno Melzner、Paul Hendrickx、Dirk Wellekens、Martino Lorenzini、Jan Van Houdt
(1.Infineon Technologies AG、2.IMEC vzw.、3.Kapeldreef 75、4.Otto-Hahn-Ring)
https://doi.org/10.7567/SSDM.2001.C-9-4