[P3-22L] Effective Prevention of Single Event Burnout for N-Channel Power MOSFETs

Yeong-Lin Lai、Chih-Yen Huang (1.Department of Mechatronics Engineering, National Changhua University of Education、2.Department of Electronic Engineering, Feng Chia University)

https://doi.org/10.7567/SSDM.2005.P3-22L