[P-1-8] Investigation of Inversion C-V Reconstruction for Long-Channel MOSFETs with Leaky Dielectrics using Intrinsic Input Resistance Approach

Wei Lee、Pin Su、Ke-Wei Su、Chung-Shi Chiang、Sally Liu (1.Department of Electronics Engineering, National Chiao Tung University、2.Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2006.P-1-8