[P-3-9] Investigation of Impact Ionization in Strained-Si nMOSFETs

Ting-Kuo Kang、Yu-Huan Sa、Po-Chin Huang、San-Lein Wu、Shoou Jinn Chang (1.Department of Electronic Engineering, Cheng Shiu University、2.Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University)

https://doi.org/10.7567/SSDM.2007.P-3-9