[B-10-2] Anomalous RTS Extractions from a Very Large Number of n-MOSFETs using TEG with 0.47 Hz - 3.0 MHz Sampling Frequency

K. Abe¹、T. Fujisawa¹、A. Teramoto¹、S. Watabe¹、S. Sugawa¹、T. Ohmi¹ (1.Tohoku Univ., Japan)

https://doi.org/10.7567/SSDM.2008.B-10-2