[J-2-4] A Study on Scaling Limit of Programming Characteristics of NOR-Flash Memories using Device Simulation

T. Ishihara¹, T. Marukame¹, K. Matsuzawa¹, T. Nakauchi¹ (1.Toshiba Corp., Japan)

https://doi.org/10.7567/SSDM.2008.J-2-4