[J-9-1] Interpretation of Resistive Switching in NiO Thin Films (Invited)

I. K. Yoo¹、B. S. Khang¹、M. J. Lee¹、Y. D. Park¹、Y. S. Park¹ (1.Samsung Electronics Co., Ltd., Korea)

https://doi.org/10.7567/SSDM.2008.J-9-1