[E-9-3] Random Telegraph Signal and Low Frequency Noise in Silicon Charge-Sensitive Electrometers

N. Clement¹、K. Nishiguchi²、A. Fujiwara²、D. Vuillaume¹ (1.IEMN(France)、2.NTT Basic Res. Labs.(Japan))

https://doi.org/10.7567/SSDM.2009.E-9-3