[J-3-3] Very Smooth SiO2/SiC Interface Formed by Supercritical Water Oxidation of Low Temperature
T. Futatsuki1,2, T. Oe2, H. Aoki1, N. Komatsu1, C. Kimura1, T. Sugino1
(1.Osaka Univ.(Japan), 2.Organo Corp.(Japan))
https://doi.org/10.7567/SSDM.2009.J-3-3