[E-4-3] POST-BREAKDOWN RECOVERABLE METAL NANOCRYSTAL-BASED AL2O3/SIO2GATE STACK FOR NON-VOLATILE MEMORY
Y. N. Chen1,2、K. L. Pey1、K. E. J. Goh2、Z. Z. Lwin1、P. K. Singh3、S. Mahapatra3、Q. X. Wang4、J. Zhu4
(1.Nanyang Tech. Univ.、2.Inst. of Material Res. and Eng.,A*STAR , Singapore、3.Indian Inst. of Tech. , India、4.GlobalFoundries Singapore Pte. Ltd , Singapore)
https://doi.org/10.7567/SSDM.2010.E-4-3