A Consistent Modeling Framework to Explain Negative Bias Temperature Instability (NBTI) DC Stress, Recovery and AC Experiments

2011 International Conference on Solid State Devices and Materials

2011年9月27日〜 2011年9月30日
Aichi Industry & Labor Center (WINC AICHI), Nagoya, Japan

S. Mahapatra¹、A. E. Islam²、S. Deora¹、V. D. Maheta¹、M. A. Alam² (1.IIT Bombay , India、2.Purdue Univ. , USA)