The Japan Society of Applied Physics

[F-3-2] Assessment of Erase-Verify Function in NAND Arrays with Charge-Based Capacitance Measurement

L. H. Chong1、Y. W. Chang1、K. F. Chen1、Y. J. Chen1、S. H. Ku1、N. K. Zous1、I. J. Huang1、T. T. Han1、M. S. Chen1、W. P. Lu1、K. C. Chen1、C. Y. Lu1 (1.Macronix Int. Co., Ltd. , Taiwan)

https://doi.org/10.7567/SSDM.2011.F-3-2