[L-2-2] Evolution of threading edge dislocation during solution growth of SiC

S. Harada¹、Y. Yamamoto¹、K. Seki¹、A. Horio¹、T. Mitsuhashi¹、T. Ujihara¹ (1.Nagoya Univ. , Japan)

https://doi.org/10.7567/SSDM.2012.L-2-2