[PS-6-23] Improved Stability of ZnO Thin Film Transistor with Dual Gate Structure under Negative Bias Stress

H.J. Yun¹、Y.S. Kim²、Y.M. Kim¹、S.D. Yang¹、H.D. Lee¹、G.W. Lee¹ (1.National Univ. of Chungnam、2.National Nanofab Center (Korea))

https://doi.org/10.7567/SSDM.2013.PS-6-23