15:00 〜 15:15

[N-1-04] Statistical Analysis of Temperature Dependence of Worst Case SRAM Data Retention Voltage Using Extreme Value Theory

^○T. Mizutani¹, K. Takeuchi¹, T. Saraya¹, M. Kobayashi¹, T. Hiramoto¹ (1.Univ. of Tokyo (Japan))

https://doi.org/10.7567/SSDM.2019.N-1-04