The Japan Society of Applied Physics

13:00 〜 15:00

[PS-1-05] Characteristic Variability and Random Telegraph Noise of Gate-All-Around Silicon Nanowire MOSFETs with Asymmetric Dual Spacer Induced by Single Charge Trap

S.R. Kola1, Y. Li1, N. Thoti1, C.-Y. Chen1, W.-L. Sung1 (1.National Chiao Tung Univ. (Taiwan))

https://doi.org/10.7567/SSDM.2019.PS-1-05