2016 Annual Meeting

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Oral Presentation

II. Radiation, Accelerator and Beam Technologies » 203-2. Beam Measurements/203-4. Synchrotron Orbital Radiation, Laser

[3M01-06] Beam measurement

Mon. Mar 28, 2016 10:15 AM - 11:55 AM Room M (Lecture Rooms C C106)

Chair: Akira Uritani (Nagoya Univ.)

11:15 AM - 11:30 AM

[3M05] Analysis of Heavy Elements on Nano-Structured Pd Multilayer Thin Films by Rutherford Backscattering Spectrometry

＊Yasuhiro Iwamura1, Jirohta Kasagi1, Shigenori Tsuruga2, Takehiko Itoh1, Hidetoshi Kikunaga1, Ryo Tajima1, Yuki Honda1 (1.Research Center for Electron Photon Science, Tohoku University , 2.Mitsubishi Heavy Industries, ltd.)

Keywords:Rutherford Backscattering Spectrometry, Nano-Structured Pd Multilayer Thin Film

We applied RBS (Rutherford Backscattering Spectrometry), for the first time, to the D2 permeated Pd multilayer thin film on which Pr was detected by ICP-MS. Preliminary analysis suggest that Pr and the other elements were obtained.