11:00 AM - 11:15 AM
[3O05] FT-IR Analysis on the Damage of Simulated Cultural Heritage Samples Induced by Ion-Beam and X-Ray Irradiation
Keywords:cultural heritage analysis, radiation damage, absorbed dose, chemical bond, FT-IR
Purpose: Analysis of cultural heritage samples using ion-beams and X-rays involves risk of damaging precious samples. Gelatin samples simulating glue as a paint base material were irradiated by protons or X-rays, and changes in the chemical bonds of the surfaces were investigated.
Methods: Proton irradiation was performed in vacuum with 2.5-MeV protons. A 40-kV X-ray tube was used for the X-ray irradiation. The doses were about 100 kGy and 10 Gy, respectively. Sample surfaces were analyzed by FT-IR spectroscopy.
Conclusions: After the proton irradiation, we observed changes in the intensities of N-H and C=O peaks on the measured FT-IR spectra, suggesting dissociation of the amide group. On the other hand, no change was identified for samples irradiated with X-rays.
Methods: Proton irradiation was performed in vacuum with 2.5-MeV protons. A 40-kV X-ray tube was used for the X-ray irradiation. The doses were about 100 kGy and 10 Gy, respectively. Sample surfaces were analyzed by FT-IR spectroscopy.
Conclusions: After the proton irradiation, we observed changes in the intensities of N-H and C=O peaks on the measured FT-IR spectra, suggesting dissociation of the amide group. On the other hand, no change was identified for samples irradiated with X-rays.