Session information

Planning Lecture

Technical division and Network » Radiation Science and Technology

[2M_PL] Soft errors in semiconductor devices due to environmental radiation

Thu. Sep 8, 2022 1:00 PM - 2:30 PM Room M (E2 Bildg.1F No.101)

Chair: Yoshihito Namito (KEK)

[2M_PL01] Recent research activities for neutron-induced soft errors in Hokkaido University

*Hirotaka Sato¹ (1. Hokkaido Univ)

[2M_PL02] Measurement of Muon-induced Soft Error and Its Challenges

*Masanori Hashimoto¹ (1. Kyoto Univ)

[2M_PL03] Simulation of soft errors due to environmental radiation

*Shinichiro Abe¹ (1. JAEA)

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