[2H01-03] F82H

[2H02] Development of a non destructive testing of F82H steel HIPed interface by high energy x-ray spectral analysis.

*Hiroshi Sakurai¹, Takashi Nozawa², Kosuke Suzuki¹, Kazushi Hoshi, Hiroto Haga³, Hiroyasu Tanigawa², Someya Yoji², Masao Tsuchiya³, Hiroshi Takeuchi³, Naruki Tsuji⁴ (1. Gunma Univ., 2. QST, 3. MTC, 4. JASRI)

Keywords:F82H steel, HIP interface, Compton scattering, High energy X-rays, NDT

This study aims to develop a non-destructive testing method for the integrity of HIP (Hot-Isostatic Pressing) joint interface of F82H steels by analyzing the scattering and fluorescence X-ray energy spectra obtained by using high energy X-ray with high transmission ability. High energy X-rays with 115.56 keV was irradiated to an F82H-BA12 steel on BL08W, SPring-8. The scattered and fluorescent X-ray energy spectra at and near the HIP joint interface were analyzed. As a result, accumulation of Ta elements and precipitation of SiO2 with small electron density were observed at the HIP interface. This is consistent with the previous EPMA analysis. Furthermore, accumulation of W elements was observed in the vicinity of the HIP interface. These results indicate that high-energy X-ray spectral analysis can be a non-destructive testing method for the HIPed interface.