[3N08-13] Nuclear Data Measurement 3

[3N12] Development of secondary light charged particles measurement system for negative muon nuclear capture reactions

*Masaya Oishi¹, Shoichiro Kawase¹, Yukinobu Watanabe¹, Teppei Kawata¹, Kitafuji Kentaro¹, Hiroki Nishibata¹, Megumi Niikura², Daisuke Suzuki², Shintaro Go², Teiichiro Matsuzaki² (1. Kyushu Univ., 2. RIKEN)

Keywords:muon nuclear capture reaction, soft error

Recently, muon induced soft errors are attracted attention due to the miniaturization of semiconductor devices. It is pointed out that secondary light charged particles created by negative muon nuclear capture (μNC) cause soft errors. Therefore, we are developing a charged particle measurement system to obtain the energy spectrum of secondary light charged particles produced by μNC which is necessary to estimate the probability of muon induced soft errors. In this measurement system, two types of telescopes with different particle identification methods are used. One is for low energy particles and composed of an nTD-Si and a Si detector. Particle stopped in the nTD-Si detector is identified by the pulse shape analysis method. Another is composed of a Si detector and a CsI scintillator. Particles with sufficient energy to penetrate the Si detector are identified by the ΔE-E method. I talk operation test of the measurement system performed at Center for Accelerator and Beam Applied Science, Kyushu University.