[1I13-17] Beam Application, Measurement

[1I13] Basic Study of Measurement Conditions for Ion Beam Induced Luminescence Analysis

*Yuma Chikamatsu¹, Naoto Hagura¹, Jun Kawarabayashi¹, Sou Watanabe² (1. Tokyo City University, 2. Japan Atomic Energy Agency)

Keywords:Ion beam induced luminescence, PIXE Analysis, TCU-Tandem

Ion beam induced luminescence (IBIL) analysis is sensitive to chemical bonding states, ion valence, crystallinity, and defects because it uses an ion beam to excite the outer shell electrons to be analyzed and detects and analyzes the electromagnetic waves (ion beam induced luminescence) of several eV generated in the relaxation process. Because of this feature, IBIL analysis has been used in the field of geology and in studies of radiation effects, but there have been few studies on the basic measurement system, so experiments were conducted to aim for optimal measurement conditions. The changes in luminescence intensity and peak wavelength when changing the beam intensity and energy of the accelerated particles, respectively, using TCU-Tandem showed that the luminescence intensity changed with beam intensity regardless of the sample being measured, but there was no effect on the peak wavelength. As for the energy, there was no change within a few milliseconds for a change of a few MeV. In the future, we are considering experiments to improve the light collection efficiency by modifying the optical system, etc.