[1I13-17] ビーム利用・計測

[1I17] Beam based gain flattening of secondary emission grid profile monitors at the Linear IFMIF Prototype Accelerator.

*De Franco Andrea¹、Benedetti Florian^2,3、Bolzon Benoit³、Chauvin Nicolas³、Jimenez David⁵、Kwon Saerom¹、Kondo Keitaro¹、Marroncle Jacques³、Morales Juan Carlos⁴、Masuda Kai¹ (1. QST、2. F4E、3. CEA、4. Granada Univ.、5. CIEMAT)

キーワード：Particle Accelerator、Beam Instrumentation、Hadron Accelerators

The commissioning of the Linear IFMIF Prototype Accelerator (LIPAc) towards 9MeV 125mA of deuteron beams in CW is progressing in phases in which the beam intensity and duty cycle is steadily increased. In the latest operation the beam was accelerated to 5MeV at a duty cycle lower than 0.1% with beam current of roughly 10mA and 20mA respectively for proton and deuteron. At this stage of beam commissioning, the secondary emission grid profile monitors installed at two locations of the accelerator are very active diagnostics. The systematic distortion of the profiles suggests a non-perfectly uniform gain across the wires. We report the planned beam-based gain flattening methods for the upcoming beam operations and the preliminary results on the limited data acquired in previous operations.