Evaluation of crystalline quality of TlBr semiconductor

Presentation information

Oral presentation

II. Radiation, Accelerator, Beam and Medical Technologies » 202-2 Radiation Physics, Radiation Detection and Measurement

Tue. Mar 14, 2023 4:05 PM - 5:10 PM Room D (12 Bildg.2F 1222)

Chair:Yoshiharu Kitayama(JAEA)

4:50 PM - 5:05 PM

*Kenichi Watanabe¹, Mitsuhiro Nogami², Keitaro Hitomi² (1. Kyushu Univ., 2. Tohoku Univ.)

Keywords:Semiconductor detector, TlBr, Neutron diffraction, Electron diffration

We discuss the evaluation results of the crystalline quality of the TlBr semiconductor using neutron and electron diffraction.