[2I04-09] Measurement and Integral Experiments

[2I07] Measurement of energy spectra of light charged particles emitted by muon-nuclear capture reaction on Si

*Kentaro Kitafuji¹, Shoichiro Kawase¹, Teppei Kawata¹, Yukinobu Watanabe¹, Megumi Niikura², Rurie Mizuno³, Dai Tomono⁴, Katsuhiko Ishida⁵, Adrian Hillier⁶ (1. Kyushu Univ., 2. RIKEN, 3. UTokyo, 4. Osaka Univ., 5. KEK, 6. RAL)

Keywords:muon-nuclear capture reaction, soft error, light charged particle, energy spectrum

A phenomenon called soft error has been drawing attention recently. It is a temporary malfunction that occurs when radiation enters the semiconductor devices in electronics, and the main cause of soft error on the ground is cosmic rays. Among cosmic rays, negative muon causes muon-nuclear capture reaction when they stop in semiconductor devices, generating new charged particles. Since the generated charged particles also cause soft error, the energy spectra of such particles is necessary to estimate the soft error rate. Therefore, we conducted the experiment at the Rutherford Appleton Laboratory to measure the energy spectra of light charged particles emitted from muon-nuclear capture reaction on Si. In this presentation, we present an overview of the experiment and its result.