[MonPM2D] (Special Session) Measurement techniques underpinning EMC reliability

[MonPM2D.2] Reference Measurement for Inter-Laboratory Comparison of Electric Field Uniformity for Radiated Immunity Testing

^○Sayaka Matsukawa(National Institute of Advanced Industrial Science and Technology), Nao Takahashi(National Institute of Advanced Industrial Science and Technology), Yuji Ano(Yamaguchi Prefectural Industrial Technology Institute), Masakatsu Fujimoto(Yamaguchi Prefectural Industrial Technology Institute), Michitaka Ameya(NMIJ/AIST)