[TueAM1E] (Tutorial Session) The importance of performing combined tests with emphasis on EMC, Functional Safety, Ionizing Radiation and Aging

[TueAM1E.1] The Importance of Performing Combined Tests With Emphasis on EMC, Functional Safety, Ionizing Radiation and Aging

^○Fabian Vargas(Leibniz Institute for High Performance Microelectronics), Bernd Deutschmann(Graz University of Technology), Nikolaus Czepl(Graz University of Technology), Daniel Kircher(Graz University of Technology)