*Aki Takahashi¹, Sho Okubo², Kana Iwakuni¹ (1. University of Electro-Communications (Japan), 2. National Institute of Advanced Industrial Science and Technology (Japan))

*Takeru Endo¹, Haochen Tian^1,2, Akifumi Asahara¹, Kaoru Minoshima¹ (1. The University of Electro-Communications (Japan), 2. Research Fellow of the Japan Society for the Promotion of Science (Japan))

*Haochen Tian^1,2, Runmin Li¹, Takeru Endo¹, Akifumi Asahara¹, Lukasz A. Sterczewski³, Kaoru Minoshima¹ (1. The Univ. of Electro-Communications (Japan), 2. Research Fellow of JSPS (Japan), 3. Wroclaw Univ. of Sci. and Tech. (Poland))

*Taro Hasegawa¹, Taiki Kageyama¹ (1. Keio University (Japan))

*Yugo Kikkawa^1,2, Atsushi Ishizawa¹, Rai Kou³, Xuejun Xu¹, Koki Yoshida^1,2, Tai Tsuchizawa⁴, takuma Aihara⁴, Tadashi Nishikawa², Guangwei Cong³, Kenichi Hitachi¹, Noritsugu Yamamoto³, Koji Yamada³, Katsuya Oguri¹ (1. NTT Basic Res. Lab., NTT Corp. (Japan), 2. Tokyo Denki Univ. (Japan), 3. Platform Photonic Res. Center, National Inst. of Advanced Indus. Sci. and Tech. (Japan), 4. NTT Device Tech. Lab., NTT corp. (Japan))

*Runmin Li¹, Haochen Tian^1,2, Takashi Kato^1,3, Akifumi Asahara¹, Kaoru Minoshima¹ (1. The Univ. of Electro-Communications (Japan), 2. Research Fellow of JSPS (Japan), 3. PRESTO, JST (Japan))

Dominik Charczun¹, Daniel Lisak¹, Akiko Nishiyama^1,2, Thibault Voumard³, Thibault Wildi³, Grzegorz Kowzan¹, Victor Brasch⁴, Tobias Herr^3,6, Adam J. Fleischer⁵, Joseph T. Hodges⁵, Roman Ciuryło¹, Agata Cygan¹, *Piotr Maslowski¹ (1. Institute of Physics, Nicolaus Copernicus University in Torun (Poland), 2. National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (Japan), 3. Deutsches Elektronen-Synchrotron DESY (Germany), 4. CSEM - Swiss Center for Electronics and Microtechnology (Switzerland), 5. Optical Measurements Group, National Institute of Standards and Technology (United States of America), 6. Physics Department, Universität Hamburg UHH (Germany))